WLCSP Probe Head
產(chǎn)品簡述
PRODUCT DESCRIPTION
特點(diǎn):
-適用于0.35 pitch以上晶圓級封裝芯片/ Applied in WLCSP package with 0.35 above
-支持射頻性能測試/ support RF performance testing
-支持-40~125°C高低溫測試/support high&low temp(-40~125°C) testing
-支持多site測試&direct docking,易安裝維護(hù)/ support multi-site testing&direct docking, easier installation and maintenance.
- 上一個(gè): Kelvin測試插座
- 下一個(gè): 標(biāo)準(zhǔn)型測試插座